INFLUENCE OF A STRONG ELECTRIC FIELD ON THE CURRENT-VOLTAGE CHARACTERISTIC OF THREE-LAYER SEMICONDUCTOR STRUCTURES IN A DIODE CONNECTION
Authors
Rasulov Rustam Yavkachovich, Rasulov Vohob Rustamovich, Khudoyberdiyeva Muhayyoxon Zoirjon-kizi, Mamadaliyeva Nargiza Zokirjon-kizi, Mamatova Mahliyo Adxamovna
Share
Annotation
The effect of an external electric field on the current-voltage characteristics of a three-layer semiconductor structure in a diode connection is calculated. It is assumed that the base of this structure is made of a compensated semiconductor, where there are three: zero, minus and charged impurities. It is taken into account that, in this case, the dependence of the electron and hole concentrations is nonlinear.
Expressions are obtained for the current-voltage characteristic of a long three-layer semiconductor for structures of the following types: p+−n−n+, p+−n−p+, n+−n−n+ etc.
Keywords
Authors
Rasulov Rustam Yavkachovich, Rasulov Vohob Rustamovich, Khudoyberdiyeva Muhayyoxon Zoirjon-kizi, Mamadaliyeva Nargiza Zokirjon-kizi, Mamatova Mahliyo Adxamovna
Share
References:
1. Taylor, J. D. (Ed.). (2000). Ultra-wideband radar technology. CRC press.
2. Rodin, P., Ebert, U., Hundsdorfer, W., & Grekhov, I. (2002). Tunnelling-assisted impact ionization fronts in semiconductors. Journal of applied physics, 92(2), 958-964.
3. Omar, M. A., & Reggiani, L. (1987). Drift and diffusion of charge carriers in silicon and their empirical relation to the electric field. Solid-state electronics, 30(7), 693-697.
4. Vainshtein, S. N., Yuferev, V. S., & Kostamovaara, J. T. (2005). Ultrahigh field multiple Gunn domains as the physical reason for superfast (picosecond range) switching of a bipolar GaAs transistor. Journal of applied physics, 97(2), 024502.
6. Rasulov, R. Ya., Rayimjonova, U., Mamatova, M. A., Nosirov, M. X., & Muminov, I. A. (2019). To the theory of current-voltage characteristics of the three-layer structure of semiconductors in diode switching. European science review, (11-12), 74-76.
7. M.A. Mamatova, R.Ya. Rasulov. Volt-ampere characteristic of multilayer semiconductor structures. Fergana. Poligraf Super Servis. 2021. 178 pages (in Uzbek).